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IEICE Trans

Keyword : statistical analysis for transistor parameters

Concise Modeling of Transistor Variations in an LSI Chip and Its Application to SRAM Cell Sensitivity Analysis
Masakazu AOKI Shin-ichi OHKAWA Hiroo MASUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/04/01
Vol. E91-C  No. 4 ; pp. 647-654
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
modeling transistor variations, within-die variation, statistical analysis for transistor parameters, SRAM cell sensitivity analysis, process window for SRAM cell operation, 
 Summary | Full Text:PDF