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IEICE Trans

Keyword : static testing

Noise-Tolerant DAC BIST Scheme Using Integral Calculus Approach
Hyeonuk SON Incheol KIM Sang-Goog LEE Jin-Ho AHN Jeong-Do KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/08/01
Vol. E94-C  No. 8 ; pp. 1344-1347
Type of Manuscript:  LETTER
Category: Electronic Circuits
Keyword: 
digital-to-analogue converter (DAC), built-in self-test (BIST), noise-immunity, static testing, 
 Summary | Full Text:PDF