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IEICE Trans

Keyword : single event double node upset

Highly Robust Double Node Upset Resilient Hardened Latch Design
Huaguo LIANG Xin LI Zhengfeng HUANG Aibin YAN Xiumin XU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2017/05/01
Vol. E100-C  No. 5 ; pp. 496-503
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
single event double node upset, single node upset, resilience, radiation hardened latch, 
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