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IEICE Trans

Keyword : separated sidewall control gate (SSCG)

FG Width Scalability of the 3-D Vertical FG NAND Using the Sidewall Control Gate (SCG)
Moon-Sik SEO Tetsuo ENDOH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/05/01
Vol. E95-C  No. 5 ; pp. 891-897
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
stacked-surrounding gate, 3-D vertical stacked cell, NAND flash memory, floating gate (FG), sidewall control gate (SCG), extended sidewall control gate (ESCG), separated sidewall control gate (SSCG), 
 Summary | Full Text:PDF