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IEICE Trans

Keyword : semiconductor-device simulation

Model for Thermal Noise in Semiconductor Bipolar Transistors at Low-Current Operation as Multidimensional Diffusion Stochastic Process
Yevgeny V.MAMONTOV Magnus WILLANDER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/07/25
Vol. E80-C  No. 7 ; pp. 1025-1042
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
silicon bipolar transistor, compact model, carriervelocity-fluctuation noise, Ito's stochastic differential equation, diffusion stochastic process, semiconductor-device simulation, spectral density, high-frequency noise, circuit simulation, 
 Summary | Full Text:PDF