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IEICE Trans

Keyword : ramp generator

High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor
Fukashi MORISHITA Wataru SAITO Norihito KATO Yoichi IIZUKA Masao ITO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2022/07/01
Vol. E105-C  No. 7 ; pp. 316-323
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
CMOS image sensor, column-parallel ADC, ramp generator, multi-functional fine pattern generator, IP test, 
 Summary | Full Text:PDF