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IEICE Trans

Keyword : point defect

Near-Field Optical Investigations of Photonic Crystal Microresonators
Ben C. BUCHLER Patrick KRAMPER Maria KAFESAKI Costas M. SOUKOULIS Vahid SANDOGHDAR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/03/01
Vol. E87-C  No. 3 ; pp. 371-377
Type of Manuscript:  INVITED PAPER (Special Section on Photonic Crystals and Their Device Applications)
Category: 
Keyword: 
photonic crystal, scanning near-field optical microscopy, SNOM, point defect, microresonator, 
 Summary | Full Text:PDF