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IEICE Trans

Keyword : pn-junction

1/5 Power Law in PN-Junction Failure Mechanism Caused by Electrical-Over-Stress
Yutaka TAJIMA Kunihiro ASADA Takuo SUGANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/02/25
Vol. E75-C  No. 2 ; pp. 207-215
Type of Manuscript:  Special Section PAPER (Special Issue on Selected Papers from '91 VPAD)
Category: 
Keyword: 
reliability, failure, pn-junction, silicon, electrostatic-discharge, 
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