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IEICE Trans

Keyword : oxide semiconductor trap density

Effects of Additive Elements on TFT Characteristics in Amorphous IGZO Films under Light Illumination Stress
Shinya MORITA Satoshi YASUNO Aya MIKI Toshihiro KUGIMIYA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/11/01
Vol. E94-C  No. 11 ; pp. 1739-1744
Type of Manuscript:  INVITED PAPER (Special Section on Electronic Displays)
Category: 
Keyword: 
thin-film-transistor, oxide semiconductor trap density, stability, 
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