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IEICE Trans

Keyword : on chip

A Standard-Cell Based On-Chip NMOS and PMOS Performance Monitor for Process Variability Compensation
Toshiyuki YAMAGISHI Tatsuo SHIOZAWA Koji HORISAKI Hiroyuki HARA Yasuo UNEKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/06/01
Vol. E96-C  No. 6 ; pp. 894-902
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
on chip, monitor, digital, process variability, standard cell, area efficiency, 
 Summary | Full Text:PDF