Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C
No. 5 ;
pp. 665-671
Type of Manuscript:
Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: General Methods, Materials, and Passive Circuits
Keyword:
single probe method, vector detection, microwave reflection coefficient, systematic error, network analyzer, |