Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2004/05/01 Vol. E87-CNo. 5 ;
pp. 665-671 Type of Manuscript: Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits) Category: General Methods, Materials, and Passive Circuits Keyword: single probe method, vector detection, microwave reflection coefficient, systematic error, network analyzer,