IEICE Trans

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IEICE Trans

Keyword : microelectronics

Characterisation of Offset Lithographic Films Using Microelectronic Test Structures Anthony J. WALTON J. Tom M. STEVENSON Leslie I. HAWORTH Martin FALLON Peter S. A. EVANS Blue J. RAMSEY David HARRISON
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/04/25 Vol. E82-C No. 4 ; pp. 576-581 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Keyword: microelectronics, test structure, offset lithography, linewidth,
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Technological Trends and Key Technologies in Intelligent Vehicles Takao SASAYAMA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/12/25 Vol. E76-C No. 12 ; pp. 1717-1726 Type of Manuscript: INVITED PAPER (Special Issue on ASICs for Automotive Electronics) Category: Keyword: automotive electronics, intelligent vehicles, microelectronics, sensing, vehicle informatics,
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