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| Keyword : metallization
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Thermal Stability of W2N Compound Barrier in W/W2N/poly-Si Gate Electrode Configuration Atsushi NOYA Mayumi B. TAKEYAMA | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2003/11/01
Vol. E86-C
No. 11 ;
pp. 2332-2335
Type of Manuscript:
LETTER
Category: Electronic Materials Keyword: metallization, MOS, gate electrode, WNx, | | | Summary | Full Text:PDF | |
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