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IEICE Trans

Keyword : memory test

Fault Diagnosis for RAMs Using Walsh Spectrum
Atsumu ISENO Yukihiro IGUCHI Tsutomu SASAO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 592-600
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Memory Testing
Keyword: 
memory test, diagnosis, BIST, fail-bitmap, Walsh spectrum, 
 Summary | Full Text:PDF
RAM BIST
Jacob SAVIR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/01/01
Vol. E84-C  No. 1 ; pp. 102-107
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
memory test, stuck-at fault, coupled-cell faults, pattern-sensitive faults, test length, confidence level, Markov chain, 
 Summary | Full Text:PDF