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IEICE Trans

Keyword : low temperature poly-Si

Reliability of Low Temperature Poly-Si GOLD (Gate-Overlapped LDD) Structure TFTs
Tetsuo KAWAKITA Hidehiro NAKAGAWA Yukiharu URAOKA Takashi FUYUKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/11/01
Vol. E85-C  No. 11 ; pp. 1854-1859
Type of Manuscript:  Special Section PAPER (Special Issue on Electronic Displays)
Category: Active Matrix Displays
Keyword: 
low temperature poly-Si, TFT, reliability, GOLD, system on panel, 
 Summary | Full Text:PDF