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IEICE Trans

Keyword : low power test pattern generator

A New Low Power Test Pattern Generator for BIST Architecture
Kicheol KIM Dongsub SONG Incheol KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/10/01
Vol. E88-C  No. 10 ; pp. 2037-2038
Type of Manuscript:  LETTER
Category: Semiconductor Materials and Devices
Keyword: 
low power BIST, low power test pattern generator, 
 Summary | Full Text:PDF