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| Keyword : leak current
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Modeling of Leak Current Characteristics in High Frequency Operation of CMOS Circuits Fabricated on SOI Substrate
Hiroshi ITO Kunihiro ASADA | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C
No. 2 ;
pp. 185-191
Type of Manuscript:
Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: SOI & Material Characterization
Keyword:
leak current, threshold voltage shift, SOI, CMOS, inverter chain, | | | Summary | Full Text:PDF | |
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