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Kink Suppression and High Reliability of Asymmetric Dual Channel Poly-Si Thin Film Transistors for High Voltage Bias Stress Joonghyun PARK Myunghun SHIN | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2019/01/01
Vol. E102-C
No. 1 ;
pp. 95-98
Type of Manuscript:
BRIEF PAPER
Category: Semiconductor Materials and Devices Keyword: poly-Si, TFT, kink, reliability, hot carrier stress, | | | Summary | Full Text:PDF | |
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