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IEICE Trans

Keyword : hot-electron reliability

Analysis of Tradeoffs between Efficiency, Power and Hot-Electron Reliability in GaAs MESFETs
Yevgeniy A. TKACHENKO Ce-Jun WEI Aleksei P. KLIMASHOV Dylan BARTLE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/07/25
Vol. E82-C  No. 7 ; pp. 1061-1066
Type of Manuscript:  Special Section PAPER (Special Issue on Microwave and Millimeter Wave Technology)
Category: Active Devices and Circuits
Keyword: 
GaAs MESFET, power amplifier, hot-electron reliability, 
 Summary | Full Text:PDF