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IEICE Trans

Keyword : histogram testing

A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters
Kicheol KIM Youbean KIM Incheol KIM Hyeonuk SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/04/01
Vol. E91-C  No. 4 ; pp. 670-672
Type of Manuscript:  LETTER
Category: Semiconductor Materials and Devices
Keyword: 
ADC testing, BIST, histogram testing, 
 Summary | Full Text:PDF