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IEICE Trans

Keyword : high yield

An Effective Defect-Repair Scheme for a High Speed SRAM
Sadayuki OOKUMA Katsuyuki SATO Akira IDE Hideyuki AOKI Takashi AKIOKA Hideaki UCHIDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/25
Vol. E76-C  No. 11 ; pp. 1620-1625
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memories)
Category: SRAM
Keyword: 
integrated electronics, defect-repair scheme, high yield, no speed degradation, distributed fuse scheme, 
 Summary | Full Text:PDF