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IEICE Trans

Keyword : gate-overlapped LDD

Hot-Carrier Reliability in Submicrometer Ultra-Thin SOI-MOSFET's
Yasuo YAMAGUCHI Masahiro SHIMIZU Yasuo INOUE Tadashi NISHIMURA Katsuhiro TSUKAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/12/25
Vol. E75-C  No. 12 ; pp. 1465-1470
Type of Manuscript:  Special Section PAPER (Special Issue on SOI (Si on Insulator) Devices)
Category: Hot Carrier
Keyword: 
thin SOI, hot-carrier, SIMOX, gate-overlapped LDD, 
 Summary | Full Text:PDF