Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2008/12/01 Vol. E91-CNo. 12 ;
pp. 1894-1898 Type of Manuscript: INVITED PAPER (Special Section on The Forefront of 21st Century Organic Molecular Electronics) Category: Keyword: field-effect transistors, gate oxide, bioelectronics, gate capacitance, gate leakage,
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