Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2011/09/01
Vol. E94-C
No. 9 ;
pp. 1375-1380
Type of Manuscript:
Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices – Papers selected from International Session on Electro-Mechanical Devices (IS-EMD2010) and other research results –)
Category:
Keyword:
sealed relay, failure process, time parameter, gap time, dynamic reliability estimation, |