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IEICE Trans

Keyword : fringe field effect

Analytical Model of Nano-Electromechanical (NEM) Nonvolatile Memory Cells
Boram HAN Woo Young CHOI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/05/01
Vol. E95-C  No. 5 ; pp. 914-916
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
nano-electromechanical (NEM) non-volatile memory cell, fringe field effect, beam width, 
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