Numerical Analysis of the Effect of Thin-Film Thickness and Material in Field Mapping of Eddy-Current Probes Using Photoinductive Technique Yen-Lin PANCheng-Chi TAIDong-Shong LIANG
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2012/01/01 Vol. E95-CNo. 1 ;
pp. 86-92 Type of Manuscript: Special Section PAPER (Special Section on Recent Progress in Electromagnetic Theory and Its Application) Category: Numerical Techniques Keyword: field mapping, finite element method (FEM), photoinductive image (PI), tilted coil,