Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2006/03/01
Vol. E89-C
No. 3 ;
pp. 364-369
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era)
Category: Signal Integrity and Variability
Keyword:
substrate noise, di/dt, feedforward active cancelling, anti-phase, ground bounce, di/dt detector, |