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IEICE Trans

Keyword : electron velocity

Noise Analysis of GaAs-MESFETs by Physics-Based Circuit Simulator Employing Monte Carlo Technique
Masahiro NAKAYAMA Shinichi NARITA Hiroki I. FUJISHIRO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/07/01
Vol. E88-C  No. 7 ; pp. 1509-1515
Type of Manuscript:  PAPER
Category: Microwaves, Millimeter-Waves
Keyword: 
Monte Carlo, GaAs, MESFET, noise figure, noise generation, electron velocity, 
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