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IEICE Trans

Keyword : dynamic frequency scaling

Experimental Evaluation of Dynamic Power Supply Noise and Logical Failures in Microprocessor Operations
Mitsuya FUKAZAWA Masanori KURIMOTO Rei AKIYAMA Hidehiro TAKATA Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4 ; pp. 475-482
Type of Manuscript:  Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era)
Category: 
Keyword: 
power supply voltage noise built-in probing circuit, failure susceptibility, dynamic frequency scaling, 
 Summary | Full Text:PDF