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IEICE Trans

Keyword : distributed built-in self-test

A Distributed BIST Technique and Its Test Design Platrorm for VLSIs
Takeshi IKENAGA Takeshi OGURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/11/25
Vol. E78-C  No. 11 ; pp. 1618-1623
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
distributed built-in self-test, image processing LSI, pseudo random pattern generator, regular pattern, space compressor, 
 Summary | Full Text:PDF