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IEICE Trans

Keyword : digital image measuring system

Application of Digital Image Measuring System (DIMS) and Shadow Image Processing Technique (SIPT) to Damage Analysis of Electrical Sliding Contact Surface
Masanari TANIGUCHI Miyataka KANAZAWA Tasuku TAKAGI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/03/25
Vol. E81-C  No. 3 ; pp. 377-383
Type of Manuscript:  Special Section PAPER (Special Issue on Electromechanical Devices and their Surface Science)
Category: 
Keyword: 
electrical sliding contact, damage analysis of contact surface, digital image measuring system, shadow image processing technique, 
 Summary | Full Text:PDF