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IEICE Trans

Keyword : device lifetime

Application of Circuit-Level Hot-Carrier Reliability Simulation to Memory Design
Peter M. LEE Tsuyoshi SEO Kiyoshi ISE Atsushi HIRAISHI Osamu NAGASHIMA Shoji YOSHIDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 595-601
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
hot-carrier degradation, reliability, device lifetime, circuit simulation, SRAM, DRAM, 
 Summary | Full Text:PDF