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IEICE Trans

Keyword : de-embed

Practical Design and Modeling Procedure of Test Structures for Microwave Bare-Chip Devices
Masanori SHIMASUE Hitoshi AOKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/01/01
Vol. E87-C  No. 1 ; pp. 60-65
Type of Manuscript:  PAPER
Category: Microwaves, Millimeter-Waves
Keyword: 
RF, de-embed, bare-chip, simulation, SPICE, characterizations, 
 Summary | Full Text:PDF