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IEICE Trans

Keyword : current drive

Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels
Takashi ITO Xiaoli ZHU Shin-Ichiro KUROKI Koji KOTANI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/11/01
Vol. E93-C  No. 11 ; pp. 1638-1644
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
nanograting, current drive, effective mobility, reliability, TDDB, NBTI, 
 Summary | Full Text:PDF