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IEICE Trans

Keyword : coupled-cell faults

RAM BIST
Jacob SAVIR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/01/01
Vol. E84-C  No. 1 ; pp. 102-107
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
memory test, stuck-at fault, coupled-cell faults, pattern-sensitive faults, test length, confidence level, Markov chain, 
 Summary | Full Text:PDF