Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2022/07/01
Vol. E105-C
No. 7 ;
pp. 301-315
Type of Manuscript:
INVITED PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category:
Keyword:
time-of-flight, CMOS image sensors, lock-in pixel, 3-D imaging, charge modulator, |