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IEICE Trans

Keyword : capture violation problem

Power Reduction during Scan Testing Based on Multiple Capture Technique
Lung-Jen LEE Wang-Dauh TSENG Rung-Bin LIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5 ; pp. 798-805
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
multiple capture technique, capture violation problem, pattern insertion, test pattern reordering, 
 Summary | Full Text:PDF