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IEICE Trans

Keyword : bit-by-bit program verify

A Novel Sensing Scheme with On-Chip Page Copy for Flexible Voltage NAND Flash Memories
Hiroshi NAKAMURA Jun-ichi MIYAMOTO Ken-ichi IMAMIYA Yoshihisa IWATA Yoshihisa SUGIURA Hideko OODAIRA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/06/25
Vol. E79-C  No. 6 ; pp. 836-844
Type of Manuscript:  Special Section PAPER (Special Issue on ULSI Memory Technology)
Category: Nonvolatile memories
Keyword: 
flash memory, sense amplifier, bit-by-bit program verify, capacitive coupling, page copy, 
 Summary | Full Text:PDF