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IEICE Trans

Keyword : atomic force microscope

A Study on Contact Spots of Earthquake Disaster Prevention Relays
Yoshitada WATANABE Yuichi HIRAKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/08/01
Vol. E91-C  No. 8 ; pp. 1211-1214
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electromechanical Devices(Selected Papers from IS-EMD2007))
Category: Contact Phenomena
Keyword: 
earthquake disaster prevention relay, contact resistance, atomic force microscope, surface potential, 
 Summary | Full Text:PDF