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IEICE Trans

Keyword : analog DFM

Layout-Aware Variability Characterization of CMOS Current Sources
Bo LIU Bo YANG Shigetoshi NAKATAKE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4 ; pp. 696-705
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
process variation, current mismatch, layout-dependent variation, analog DFM, 
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