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IEICE Trans

Keyword : alpha-particles

Soft Error Hardened Latch Scheme with Forward Body Bias in a 90-nm Technology and Beyond
Yoshihide KOMATSU Yukio ARIMA Koichiro ISHIBASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/03/01
Vol. E89-C  No. 3 ; pp. 384-391
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era)
Category: Soft Error
Keyword: 
cosmic-ray, critical charge, forward body bias, alpha-particles, soft error rate, 
 Summary | Full Text:PDF