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IEICE Trans

Keyword : RTN

Comprehensive Analysis of Read Fluctuations in ReRAM CiM by Using Fluctuation Pattern Classifier
Ayumu YAMADA Zhiyuan HUANG Naoko MISAWA Chihiro MATSUI Ken TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2024/10/01
Vol. E107-C  No. 10 ; pp. 416-425
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Their Application Technologies)
Category: 
Keyword: 
ReRAM, Computation-in-Memory (CiM), fluctuation, RTN, oxygen vacancy, 
 Summary | Full Text:PDF
Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs
Hochul LEE Youngchang YOON Seongjae CHO Hyungcheol SHIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/05/01
Vol. E90-C  No. 5 ; pp. 968-972
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Ultra-Thin Gate Insulators
Keyword: 
trap depth, RTN, time constants, poly gate depletion effect, surface potential variation, 
 Summary | Full Text:PDF