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IEICE Trans

Keyword : Neutron-induced Soft Error

Impact of Cell Distance and Well-contact Density on Neutron-induced Multiple Cell Upsets
Jun FURUTA Kazutoshi KOBAYASHI Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/04/01
Vol. E98-C  No. 4 ; pp. 298-303
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design---Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
Neutron-induced Soft Error, Multiple Cell Upset (MCU), cell distance, well-contact density, Flip-Flop, 
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