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IEICE Trans

Keyword : NMOS

Verification of Stable Circuit Operation of 180 nm Current Controlled MOS Current Mode Logic under Threshold Voltage Fluctuation
Masashi KAMIYANAGI Takuya IMAMOTO Takeshi SASAKI Hyoungjun NA Tetsuo ENDOH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/05/01
Vol. E94-C  No. 5 ; pp. 760-766
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
current controlled-MCML, MCML, Vth fluctuation, stability, NMOS, PMOS, 
 Summary | Full Text:PDF