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IEICE Trans

Keyword : LSI failure analysis

Database with LSI Failure Analysis Navigator
Takahiro ITO Tadao TAKEDA Shigeru NAKAJIMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/03/25
Vol. E79-C  No. 3 ; pp. 272-276
Type of Manuscript:  Special Section PAPER (Special Issue on Scientific ULSI Manufacturing Technology)
Category: CIM/CAM
Keyword: 
LSI failure analysis, database, object-oriented database, 
 Summary | Full Text:PDF
LSI Failure Analysis with CAD-Linked Electron Beam Test System and Its Cost Evaluation
Hiromu FUJIOKA Koji NAKAMAE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 535-545
Type of Manuscript:  INVITED PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
LSI failure analysis, electron beam testing, CAD data, cost evaluation, 
 Summary | Full Text:PDF