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IEICE Trans

Keyword : Kelvin probe force microscopy

Surface Potential Measurement of Organic Multi-layered Films on Electrodes by Kelvin Probe Force Microscopy
Nobuo SATOH Shigetaka KATORI Kei KOBAYASHI Kazumi MATSUSHIGE Hirofumi YAMADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/02/01
Vol. E98-C  No. 2 ; pp. 91-97
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Organic Molecular Electronics)
Category: 
Keyword: 
dynamic force microscopy, Kelvin probe force microscopy, metal-shadow-mask deposition, organic light emitting diode, 
 Summary | Full Text:PDF