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IEICE Trans

Keyword : FIP

A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip
Shoichiro KAWASHIMA Isao FUKUSHI Keizo MORITA Ken-ichi NAKABAYASHI Mitsuharu NAKAZAWA Kazuaki YAMANE Tomohisa HIRAYAMA Toru ENDO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/10/01
Vol. E90-C  No. 10 ; pp. 1941-1948
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Technology toward Frontiers of New Market)
Category: Next-Generation Memory for SoC
Keyword: 
FeRAM, BGS, 2T2C-reference, FIP, self-timing, ECC, Smart Card, 
 Summary | Full Text:PDF