Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2005/01/01
Vol. E88-C
No. 1 ;
pp. 77-82
Type of Manuscript:
Special Section PAPER (Special Section on Recent Trends of Microwave and Millimeter-Wave Passive Circuit Components and Technologies for Improvement of Characteristics)
Category: Keyword: microwave, FD-TD techniques, probe field mapping, coaxial probe, microstrip-line, measurement, |