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IEICE Trans

Keyword : E-beam testing

E-Beam Static Fault Imaging with a CAD Interface and Its Application to Marginal Fault Diagnosis
Norio KUJI Kiyoshi MATSUMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 552-559
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
E-beam testing, fault diagnosis, marginal fault, fault image, fault tracing, 
 Summary | Full Text:PDF